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한국전기화학회 한국전기화학회

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Vol.7, No.2, May 2004

Fundamentals and Applications of Multi-functional NSOM Technology to Characterization of Nano Structured Materials다기능 NSOM (mf-NSOM) 을 이용한 나노 구조 재료 분석에 관한 원리와 응용
JKES Vol.7, No.2, pp.108~123, May 2004
DOI : 10.5229/JKES.2004.7.2.108
Woo-Jin Lee, Su-Il Pyun, and W. H. Smyrl이우진, 변수일, W. H. Smyrl
Corrosion Research Center, University of Minnesota, Mineapolis 55421, USA *Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Republic of Korea미네소타대학교 부식연구센터, 한국과학기술원 신소재공학과
Imaging of surfaces and structures by near-field scanning optical microscopy (NSOM) has matured and is routinely used for studies ranging from biology to materials science. Of interest in this review paper is a versatility of modified or multi-functional
Keyword : NSOM, Pitting, Imaging, Nanometal synthesis

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